Classification and cost estimation of WIP bubbles in a fab Conference Paper uri icon

abstract

  • The purpose of this article is to define and quantify the bubble phenomenon in a semiconductors fab. A" local bubble" is a relatively acute local and temporal WIP congestion. The local bubble is empirically identified and its impact on the local cycle time distribution is assessed. We then estimate its marginal impact on the overall line cycle time and cost. Finally, a novel visualization of the bubble progression is proposed

publication date

  • January 1, 2005